A Practical BIST TPG Design Methodology
نویسندگان
چکیده
This paper describes a new technique for the design of BIST TPGs. The TPG design technique identiies compatible circuit inputs that can be connected to the same TPG stage. The key idea is that compatibility between the circuit inputs is determined by analyzing the circuit logic. Unlike pseudo-exhaustive testing, circuit inputs that fanout to the same output can be compatible, provided that connecting them to the same TPG stage does not cause any loss of fault coverage. Experimental results show that TPGs designed with the proposed technique achieve 100% stuck-at fault coverage in practical test length without adding extra hardware.
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